Shenzhen Yijie Testing Technology Co., Ltd.

General business items: development of testing technology for electronic products; Technical development, sales, and other domestic trade of electronic products (excluding projects that require approval before registration as stipulated by laws, administrative regulations, or State Council decisions); Leasing of electronic instruments; Information consulting (excluding talent brokerage, securities, insurance, fund, financial business, and other restricted items); Import and export business (except for projects prohibited by laws, administrative regulations, or State Council decisions; restricted projects may only be operated after obtaining permission). Manufacturing of specialized equipment for semiconductor devices; Manufacturing of integrated circuit chips and products; Manufacturing of optoelectronic devices; Manufacturing of electronic measuring instruments; Information system integration services; Repair of instruments and meters. (Except for projects that require approval according to law, business activities may be carried out independently with a business license) Licensed business items: Inspection and testing services. (Projects subject to approval according to law may …

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会社概要

General business items: development of testing technology for electronic products; Technical development, sales, and other domestic trade of electronic products (excluding projects that require approval before registration as stipulated by laws, administrative regulations, or State Council decisions); Leasing of electronic instruments; Information consulting (excluding talent brokerage, securities, insurance, fund, financial business, and other restricted items); Import and export business (except for projects prohibited by laws, administrative regulations, or State Council decisions; restricted projects may only be operated after obtaining permission). Manufacturing of specialized equipment for semiconductor devices; Manufacturing of integrated circuit chips and products; Manufacturing of optoelectronic devices; Manufacturing of electronic measuring instruments; Information system integration services; Repair of instruments and meters. (Except for projects that require approval according to law, business activities may be carried out independently with a business license) Licensed business items: Inspection and testing services. (Projects subject to approval according to law may …

100.00

誠実性スコア

100.00

納品履行スコア

私たちのブランド

Shenzhen Yijie Testing Technology Co., Ltd. は、B2B製造とグローバル貿易における卓越性を追求しています。
確かなものづくりと革新的な技術を組み合わせ、期待を超える製品をお届けします。
専門チームが、すべての出荷が最高水準の品質と信頼性を満たすよう徹底しています。

品質保証

すべての生産工程で厳格な品質管理を実施

グローバル展開

信頼できる物流で世界各地の市場へ輸出

お客様第一

すべての取引先に専任サポートチームを配置

実績データ

世界のパートナーから信頼される実績 — 数字がそれを証明します

15+

年の実績

500+

商品

50+

輸出国・地域

3000+

満足顧客数

私たちの商品

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価格表を入手 ワンクリックで価格とMOQを確認
MPI High and Low Probe Station TS300-SE Easy Joy Test GBITEST Semiconductor Test System brand is reliable
MPI High and Low Probe Station TS300-SE Easy Joy Test GBITEST Semiconductor Test System brand is reliable

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

High-frequency fully automatic high-low temperature probe station TS3500-SE 5G-6G, millimeter wave development, 110G probe
High-frequency fully automatic high-low temperature probe station TS3500-SE 5G-6G, millimeter wave development, 110G probe

$0.77

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Yijie tests high and low temperature probe stations, RF millimeter wave tests, noise tests TS3000-SE
Yijie tests high and low temperature probe stations, RF millimeter wave tests, noise tests TS3000-SE

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

The MPI probe station TS3000-IFE is used for wafer-level reliability/silicon photonics and RF/millimeter-wave testing
The MPI probe station TS3000-IFE is used for wafer-level reliability/silicon photonics and RF/millimeter-wave testing

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Single DIE Test Probe Station | High-Density Chip Test Station DTS-650DI
Single DIE Test Probe Station | High-Density Chip Test Station DTS-650DI

$0.77

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Domestic fully automatic silicon photonic probe station TS3000-IFE RF microwave reliability testing
Domestic fully automatic silicon photonic probe station TS3000-IFE RF microwave reliability testing

$1,383.58

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

The high-end 8-inch domestic manual probe station GP200 is used for silicon photonics, RF testing, and DC measurement
The high-end 8-inch domestic manual probe station GP200 is used for silicon photonics, RF testing, and DC measurement

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MAURY Terahertz Active Load Traction TUNER Easy Testing Direct from Manufacturer Quality Upgrade
MAURY Terahertz Active Load Traction TUNER Easy Testing Direct from Manufacturer Quality Upgrade

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MPI 8-inch TS200-HP high-voltage probe station for high current wafer-level measurement
MPI 8-inch TS200-HP high-voltage probe station for high current wafer-level measurement

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Silicon Photonics MPI Probe Station DP80 Single DIE Optical Die/Optical Module Test System
Silicon Photonics MPI Probe Station DP80 Single DIE Optical Die/Optical Module Test System

$0.46

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MPI probe station TS200 RF i-test testing equipment is a best-selling test equipment for semiconductor laboratories
MPI probe station TS200 RF i-test testing equipment is a best-selling test equipment for semiconductor laboratories

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Hanwa HDE-C5000R Fully Automatic Chip CDM Tester (Meets JEITA / ESDA / JEDEC Specifications)
Hanwa HDE-C5000R Fully Automatic Chip CDM Tester (Meets JEITA / ESDA / JEDEC Specifications)

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

XT981 Series| Maury High Gamma Autotuner 225MHz-8GHz
XT981 Series| Maury High Gamma Autotuner 225MHz-8GHz

$15,372.98

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

EasyJet tests Maury AT series high-precision fixed coaxial attenuators and RF microwave device characterization
EasyJet tests Maury AT series high-precision fixed coaxial attenuators and RF microwave device characterization

$0.46

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

EasyJet Testing TS3000Siph+GBIT Silicon Photonics Wafer Testing System Probe Probe Socket
EasyJet Testing TS3000Siph+GBIT Silicon Photonics Wafer Testing System Probe Probe Socket

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

EasyJet Test TS2000-HP High-Voltage Probe Station Integrated Software Supports Multi-Format Output
EasyJet Test TS2000-HP High-Voltage Probe Station Integrated Software Supports Multi-Format Output

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Maury Tuner 3.5mm and 7-Harmonic Automatic Tuner Equipment XT981ML01 instrument accessories
Maury Tuner 3.5mm and 7-Harmonic Automatic Tuner Equipment XT981ML01 instrument accessories

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Domestic fully automatic probe station, on-wafer device testing expert, for semiconductor use
Domestic fully automatic probe station, on-wafer device testing expert, for semiconductor use

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MPI TS2000-IFE wafer testing high and low temperature probe stations, easy-speed wafers, on-chip testing systems
MPI TS2000-IFE wafer testing high and low temperature probe stations, easy-speed wafers, on-chip testing systems

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

EasyJet tests the TS2000-HP high-voltage probe station SiC and GaN high-power device testing systems
EasyJet tests the TS2000-HP high-voltage probe station SiC and GaN high-power device testing systems

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MPI TS3000 Semi-Automatic Probe Station 12-inch Wafer Testing Highly Reliable
MPI TS3000 Semi-Automatic Probe Station 12-inch Wafer Testing Highly Reliable

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

MPI probe station TS2000-SE high and low temperature RF i-test system terahertz
MPI probe station TS2000-SE high and low temperature RF i-test system terahertz

$1.38

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

EMMI low-light microscope Dedicated for Failure Analysis Phase-Locked Thermal Imaging System
EMMI low-light microscope Dedicated for Failure Analysis Phase-Locked Thermal Imaging System

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

Germany Zeiss quantity 999 Component analysis standard testing 5-7 days scanning electron microscopy
Germany Zeiss quantity 999 Component analysis standard testing 5-7 days scanning electron microscopy

$1.54

MOQ: 1

ログイン カートへの追加や見積依頼にはログインが必要です。

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